1999 IEEE International Test Conference (CD-ROM)
  • 1999 IEEE International Test Conference (CD-ROM)

1999 IEEE International Test Conference (CD-ROM)

£233.40
CD-ROM Published: 31/10/1999
  • Can be ordered from our supplier

Usually sourced in 7 weeks

  • This item has been added to your basket

Check Marketplace availability

The proceedings of the 1999 IEEE Test Conference contain papers on various aspects of designing and testing computer hardware. Topics addressed include: MCM and known-good-die testing; analogue test methods; production wafer testing; and diagnosis of integrated-circuit process defects.

Publisher: I.E.E.E.Press
ISBN: 9780780357563

You may also be interested in...

Your review has been submitted successfully.

We would love to hear what you think of Waterstones. Why not review Waterstones on Trustpilot?


Review us on Trustpilot