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1999 IEEE International Test Conference (CD-ROM)
  • 1999 IEEE International Test Conference (CD-ROM)

1999 IEEE International Test Conference (CD-ROM)

£233.40
CD-ROM Published: 31/10/1999
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The proceedings of the 1999 IEEE Test Conference contain papers on various aspects of designing and testing computer hardware. Topics addressed include: MCM and known-good-die testing; analogue test methods; production wafer testing; and diagnosis of integrated-circuit process defects.

Publisher: I.E.E.E.Press
ISBN: 9780780357563

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