Yield Simulation for Integrated Circuits - The Springer International Series in Engineering and Computer Science 33 (Paperback)D.M.H. Walker (author)
- We can order this
Publisher: Springer-Verlag New York Inc.
Number of pages: 209
Weight: 349 g
Dimensions: 235 x 155 x 12 mm
Edition: Softcover reprint of hardcover 1st ed. 1987
You may also be interested in...
Please sign in to write a review