VLSI Test Symposium (VTS 2004) (Paperback)
  • VLSI Test Symposium (VTS 2004) (Paperback)
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VLSI Test Symposium (VTS 2004) (Paperback)

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£189.95
Paperback 550 Pages / Published: 31/08/2004
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The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

Publisher: IEEE Computer Society Press,U.S.
ISBN: 9780769521343
Number of pages: 550

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