VLSI Test Symposium (VTS 2003), 21st IEEE (Paperback)IEEE (author)
Paperback 492 Pages / Published: 30/06/2003
- Not available
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
Number of pages: 492
Weight: 1043 g
Dimensions: 279 x 216 mm
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