Untersuchung Und Reduzierung Des Leckstroms Integrierter Schaltungen in Nanometer-Technologien Bei Konstanten Performanceanforderungen (Paperback)Frank Sill (author)
Paperback Published: 12/01/2009
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Publisher: Grin Publishing
Weight: 308 g
Dimensions: 210 x 148 x 13 mm
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£63.72Mixed media product
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