This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
Publisher: Springer-Verlag New York Inc.
Number of pages: 775
Weight: 2999 g
Dimensions: 279 x 210 x 56 mm
Edition: 2nd ed. 2009
From the reviews of the second edition:
"This book is intended to be used as a textbook for material science students studying the theory, operation, and application of the TEM. It is truly a book so thoughtfully written that ... it will provide a solid foundation for those studying material science. It is richly illustrated with full-color figures and illustrations throughout the text. ... There are an abundant number of references at the end of each chapter for further study ... . This is an outstanding book ... ." (IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010)
"D.B. Williams and C.B. Carter have now prepared a new edition, splendidly produced by Springer with colour throughout. ... This textbook is magnificent, written in a very readable style, immensely knowledgeable, drawing attention to difficulties and occasionally to unsolved problems. Any microscopist who has mastered ... the book relevant to his projects will be well armed for battle. ... Buy this book!" (P. W. Hawkes, Ultramicroscopy, Vol. 110, 2010)