Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Number of pages: 764
Weight: 1181 g
Dimensions: 235 x 155 x 40 mm
Edition: 4th ed. 2013
John Hutchison in Journal of Microscopy
``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''
Ray Egerton in Micron
``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''
John C. H. Spence, Arizona State University
``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.''
Colin Humphreys, Cambridge University
``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.''
Ronald Gronsky, University of California, Berkeley
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