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Thermal Testing of Integrated Circuits (Paperback)
  • Thermal Testing of Integrated Circuits (Paperback)
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Thermal Testing of Integrated Circuits (Paperback)

(author), (author)
£92.00
Paperback 204 Pages / Published: 21/09/2011
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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

Publisher: Springer-Verlag New York Inc.
ISBN: 9781441952875
Number of pages: 204
Weight: 349 g
Dimensions: 235 x 155 x 12 mm
Edition: Softcover reprint of the original 1st ed. 200

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