Testing Static Random Access Memories: Defects, Fault Models and Test Patterns - Frontiers in Electronic Testing 26 (Paperback)Said Hamdioui (author)
- We can order this
-Fault primitive based analysis of memory faults,
-A complete framework of and classification memory faults,
-A systematic way to develop optimal and high quality memory test algorithms,
-A systematic way to develop test patterns for any multi-port SRAM,
-Challenges and trends in embedded memory testing.
Publisher: Springer-Verlag New York Inc.
Number of pages: 221
Weight: 379 g
Dimensions: 235 x 155 x 13 mm
Edition: Softcover reprint of the original 1st ed. 200
From the reviews:
"Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. ... This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. ... The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is well-organized and very timely. ... The book promises to make valuable contribution to the education of graduate students ... . I highly recommend this book ... ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)
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