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Test Structure, Modeling and Characterization of CMOS-Based RF Devices (Hardback)
  • Test Structure, Modeling and Characterization of CMOS-Based RF Devices (Hardback)
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Test Structure, Modeling and Characterization of CMOS-Based RF Devices (Hardback)

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£56.95
Hardback 320 Pages / Published: 17/02/2004
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Due to the explosive growth in the worldwide internet economy, many researchers and engineers are now engaged in the design and manufacturing of RF electronics. This book provides readers with an authoritative, highly practical resource they can use in the design, modeling, and characterization of CMOS-based RF semiconductor devices. It considers not only the active devices, but also the passive devices frequently used in RF circuits. Plus, it offers a balanced approach, integrating test structure, measurement, and parameter extraction. Examples of SPICE circuit simulation are also provided.

Publisher: John Wiley and Sons Ltd
ISBN: 9780471469650
Number of pages: 320
Dimensions: 250 x 150 mm

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