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Test Conference 1998: International Conference Proceedings (Paperback)
  • Test Conference 1998: International Conference Proceedings (Paperback)
£194.50
Paperback Published: 31/01/1999
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ITC is a technical conference on the testing and total quality of integrated electronic circuits, and the assemblies and systems that are based on them. This is a collection of papers covering topics such as; dynamic current testing; MCM systems design; memory test; and unpowered opens.

Publisher: I.E.E.E.Press
ISBN: 9780780350922

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