This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Publisher: Springer-Verlag New York Inc.
Number of pages: 212
Weight: 361 g
Dimensions: 235 x 155 x 12 mm
Edition: 2012 ed.
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