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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices (Hardback)
  • Terrestrial Neutron-induced Soft Error In Advanced Memory Devices (Hardback)
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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices (Hardback)

(author), (author), (author)
£123.00
Hardback 368 Pages / Published: 03/04/2008
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Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Publisher: World Scientific Publishing Co Pte Ltd
ISBN: 9789812778819
Number of pages: 368
Weight: 658 g
Dimensions: 231 x 155 x 20 mm

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