Tdcv Characterization of Defects in Ultra Thin Sio2 Kinds of Films (Paperback)
  • Tdcv Characterization of Defects in Ultra Thin Sio2 Kinds of Films (Paperback)
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Tdcv Characterization of Defects in Ultra Thin Sio2 Kinds of Films (Paperback)

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£40.00
Paperback Published: 29/06/2010
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Publisher: LAP Lambert Academic Publishing
ISBN: 9783838351544
Weight: 186 g
Dimensions: 229 x 152 x 7 mm

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