Surface Microscopy with Low Energy Electrons (Paperback)Ernst Bauer (author)
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This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Publisher: Springer-Verlag New York Inc.
Number of pages: 496
Weight: 8662 g
Dimensions: 235 x 155 mm
Edition: Softcover reprint of the original 1st ed. 201
"The book is certain to become the bible of LEEM, PEEM, and related instruments. ... this is essentially a book for experimentalists, packed with data, excellent figures (ray diagrams, plots of important experimental results), and photographs of instruments. The book is unusually clearly and concisely written, and well referenced ... and truly represents the summation of a lifetime's work devoted to this field by its originator." (John C. H. Spence, Microscopy and Microanalysis, Vol. 21 (3), 2015)
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