Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings - Image Processing, Computer Vision, Pattern Recognition, and Graphics 8621 (Paperback)Marco Loog (editor), Francisco Escolano (editor), Marcello Pelillo (editor)
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Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Number of pages: 478
Weight: 7489 g
Dimensions: 235 x 155 x 26 mm
Edition: 2014 ed.
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