Spectroscopic Ellipsometry for the In-Situ Investigation of Atomic Layer Depositions (Paperback)
  • Spectroscopic Ellipsometry for the In-Situ Investigation of Atomic Layer Depositions (Paperback)
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Spectroscopic Ellipsometry for the In-Situ Investigation of Atomic Layer Depositions (Paperback)

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£40.50
Paperback 112 Pages / Published: 27/04/2015
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Publisher: Grin Publishing
ISBN: 9783656923152
Number of pages: 112
Weight: 154 g
Dimensions: 210 x 148 x 7 mm

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