This book presents a range of applications for low-energy electron diffraction (LEED), Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). It applies both scanning tunneling and atomic force microscopy to in situ studies of structures of substrates and adsorbates during electrochemical measurements. It then presents a theoretical approach to modelling the electrochemical interface.
Publisher: American Chemical Society
Number of pages: 368
Weight: 620 g
Dimensions: 235 x 157 x 22 mm
You may also be interested in...
Please sign in to write a review
Simply reserve online and pay at the counter when you collect. Available in shop from just two hours, subject to availability.
Thank you for your reservation
Your order is now being processed and we have sent a confirmation email to you at
When will my order be ready to collect?
Following the initial email, you will be contacted by the shop to confirm that your item is available for collection.
Call us on or send us an email at
Unfortunately there has been a problem with your order
Please try again or alternatively you can contact your chosen shop on or send us an email at