This book presents a range of applications for low-energy electron diffraction (LEED), Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). It applies both scanning tunneling and atomic force microscopy to in situ studies of structures of substrates and adsorbates during electrochemical measurements. It then presents a theoretical approach to modelling the electrochemical interface.
Publisher: American Chemical Society
Number of pages: 368
Weight: 620 g
Dimensions: 235 x 157 x 22 mm
You may also be interested in...
Please sign in to write a review
Thank you for your reservation
Your order is now being processed and we have sent a confirmation email to you at
When will my order be ready to collect?
Call us on or send us an email at
Unfortunately there has been a problem with your order
Please try again or alternatively you can contact your chosen shop on or send us an email at