Software Defect and Operational Profile Modeling - International Series in Software Engineering 4 (Paperback)Kai-Yuan Cai (author)
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Publisher: Springer-Verlag New York Inc.
Number of pages: 268
Weight: 450 g
Dimensions: 235 x 155 x 15 mm
Edition: Softcover reprint of the original 1st ed. 199
Computing Reviews (June 1999)
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