This text examines the application of positron beams to studies of solids and surfaces with profiles for an increasing array of materials. It presents the progress made in areas of defect profiling, including improvements in theoretical modelling and the realization of the power of pulsed variable-energy beam lifetime techniques. Coverage of the current use of slow positron beams for the development of positron microscopes, as well as other future applications to materials science, is included.
Publisher: American Institute of Physics ISBN: 9781563962677 Number of pages: 640 Weight: 1035 g Dimensions: 230 x 150 x 39 mm
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