Single Event Upsets in Sub-65nm CMOS Technologies (Paperback)
  • Single Event Upsets in Sub-65nm CMOS Technologies (Paperback)
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Single Event Upsets in Sub-65nm CMOS Technologies (Paperback)

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£58.00
Paperback Published: 01/12/2011
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Publisher: LAP Lambert Academic Publishing
ISBN: 9783846595510
Weight: 290 g
Dimensions: 229 x 152 x 11 mm

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