Semiconductor Thermal Measurement and Management (SEMI-THERM): 18th Symposium (Paperback)IEEE Electron Devices Society (author)
Paperback 210 Pages / Published: 31/03/2002
- Not available
This volume originates from the 18th Symposium on Semiconductor Thermal Measurement and Management and examines components. It covers topics including: advances in compact models; package and material characterization; system level analysis; and liquid cooling application.
Number of pages: 210
Dimensions: 279 x 216 mm
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