Semiconductor Materials: Characterisation Techniques (Hardback)P.R. Vaya (editor)
Hardback 320 Pages / Published: 01/10/1994
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In this work, scientists working in the field of semiconductor materials discuss the latest and the emerging techniques of characterization. Topics covered include: ellipsometry; transmission electron microscopy; X-ray photoelectron spectroscopy; and electro-optic devices.
Publisher: Narosa Publishing House
Number of pages: 320
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