Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale (Hardback)
  • Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale (Hardback)
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Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale (Hardback)

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£299.99
Hardback 980 Pages / Published: 18/12/2006
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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Publisher: Springer-Verlag New York Inc.
ISBN: 9780387286679
Number of pages: 980
Weight: 2180 g
Dimensions: 235 x 155 x 31 mm
Edition: 2007 ed.


MEDIA REVIEWS

From the reviews:

"The stated goal of this book is `to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.' ... The images are particularly clear even to the non-specialist eyes. ... The black and white and color figures are of good quality. The photographs are all excellent. ... will be helpful to materials scientists in universities and research centers." (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)

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