Scanning Microscopy for Nanotechnology: Techniques and Applications (Hardback)
  • Scanning Microscopy for Nanotechnology: Techniques and Applications (Hardback)
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Scanning Microscopy for Nanotechnology: Techniques and Applications (Hardback)

(editor), (editor)
£159.99
Hardback 522 Pages / Published: 27/11/2006
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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Publisher: Springer-Verlag New York Inc.
ISBN: 9780387333250
Number of pages: 522
Weight: 1083 g
Dimensions: 235 x 155 x 30 mm
Edition: 2007 ed.

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