Scanning Microscopie 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Proceedings of SPIE No. 8729 (Paperback)Dale Newbury (editor), S. Frank Platek (editor), Michael T. Postek (editor), Tim Maugel (editor)
Paperback 277 Pages / Published: 30/07/2013
- Not available
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Publisher: SPIE Press
Number of pages: 277
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