Residual Stress Measurement by X-Ray Diffraction (Paperback)SAE International (author)
Paperback 96 Pages / Published: 28/02/2003
- Not available
This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available. The purpose of this revision is not to incorporate all of the research in the fields of x-ray and neutron diffraction but to focus on the practical applications of x-ray diffraction techniques useful to members of the automotive engineering related industries.
Publisher: SAE International
Number of pages: 96
Dimensions: 279 x 229 mm
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