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Reliability of High-K / Metal Gate Field-Effect Transistors Considering Circuit Operational Constraints (Paperback)
  • Reliability of High-K / Metal Gate Field-Effect Transistors Considering Circuit Operational Constraints (Paperback)
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Reliability of High-K / Metal Gate Field-Effect Transistors Considering Circuit Operational Constraints (Paperback)

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£28.90
Paperback Published: 06/06/2016
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Publisher: Books on Demand
ISBN: 9783741208690
Weight: 159 g
Dimensions: 210 x 148 x 7 mm

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