Reliability and Degradation of III-V Optical Devices - Solid State Technology & Devices Library (Hardback)Osamu Ueda (author)
Hardback 372 Pages / Published: 30/09/1996
- Not available
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.
Publisher: Artech House Publishers
Number of pages: 372
Weight: 698 g
Dimensions: 234 x 156 x 22 mm
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