Thin rare earth (RE) oxide films are emerging materials for microelectronic, nanoelectronic, and spintronic applications. The state-of-the-art of thin film deposition techniques as well as the structural, physical, chemical, and electrical properties of thin RE oxide films and of their interface with semiconducting substrates are discussed. The aim is to identify proper methodologies for the development of RE oxides thin films and to evaluate their effectiveness as innovative materials in different applications.
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Number of pages: 427
Weight: 744 g
Dimensions: 235 x 155 x 21 mm
Edition: 2007 ed.
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