Paperback. This book contains the papers presented at ESREF 99, the 10th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, held in Arcachon, near Bordeaux (France) from 5-8 October 1999. The papers are being published concurrently as a special issue of the journal Microelectronics Reliability. The ESREF symposium provides designers, founders and users with an international forum for presenting recent developments and future trends in the quality and reliability of materials, devices and circuits for microelectronics. The symposium addresses all aspects of specification, technology and manufacturing, test, control and analysis. 19 papers presented as posters accompany the 42 oral papers. The accepted papers, from Europe, the United States and Asia, cover the following topics: - Quality and reliability - Modelling of failure mechanisms: ESD, electromigration, oxide and MOS - Electron and optica
Publisher: Elsevier Science & Technology
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