On-Chip Nbti and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI Circuits (Paperback)
  • On-Chip Nbti and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI Circuits (Paperback)
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On-Chip Nbti and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI Circuits (Paperback)

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£59.00
Paperback Published: 01/09/2011
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Publisher: Proquest, Umi Dissertation Publishing
ISBN: 9781244678286
Weight: 231 g
Dimensions: 246 x 189 x 7 mm

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