Noise in Semiconductor Devices: Modeling and Simulation - Springer Series in Advanced Microelectronics 7 (Paperback)
  • Noise in Semiconductor Devices: Modeling and Simulation - Springer Series in Advanced Microelectronics 7 (Paperback)
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Noise in Semiconductor Devices: Modeling and Simulation - Springer Series in Advanced Microelectronics 7 (Paperback)

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£109.99
Paperback 213 Pages / Published: 26/12/2012
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Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN: 9783642085864
Number of pages: 213
Weight: 385 g
Dimensions: 235 x 155 x 13 mm
Edition: Softcover reprint of the original 1st ed. 200


MEDIA REVIEWS

From the reviews of the first edition:

"This book is devoted to the research and estimation of the electrical noise generated by active semiconductor devices. It provides a thorough introduction to the physics-based numerical modeling of these devices operating both in small-signal and in large-signal conditions. ... this comprehensive treatment of the numerical simulation of noise in semiconductor devices successfully combines a modern physical understanding with rigorous mathematics and numerical methods. This book should be recommended to scientists and engineers of corresponding specialties ... ." (I. A. Parinov, Zentralblatt MATH, Vol. 1044 (19), 2004)

"Bonani and Ghione have written an excellent source book for research engineers and scientists interested in the modelling of noise in semiconductor devices. ... Compact noise models are derived from analytic models and numerical methods are presented to solve for the complex and realistic models. ... There is a useful and reasonably comprehensive bibliography. I strongly recommend this book to specialists in the area." (B. D. Nener, The Physicist, Vol. 39 (2), 2002)

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