Nanometer Technology Designs: High-Quality Delay Tests (Hardback)Nisar Ahmed (author)
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Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Publisher: Springer-Verlag New York Inc.
Number of pages: 281
Weight: 619 g
Dimensions: 235 x 155 x 17 mm
Edition: 2008 ed.
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