Visit our Christmas Gift Finder
Click & Collect from 2 Hours
Last Christmas Delivery Dates
Free UK Standard Delivery on orders £20 and over Order in time for Christmas 18th December 2nd Class | 19th December 1st Class Free Click & Collect to shops From 2 hours of your order*
Nanometer-scale Defect Detection Using Polarized Light (Hardback)
  • Nanometer-scale Defect Detection Using Polarized Light (Hardback)

Nanometer-scale Defect Detection Using Polarized Light (Hardback)

(author), (author), (author)
Hardback 316 Pages / Published: 12/08/2016
  • We can order this

Usually dispatched within 1 week

  • This item has been added to your basket
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

Publisher: ISTE Ltd and John Wiley & Sons Inc
ISBN: 9781848219366
Number of pages: 316
Weight: 618 g
Dimensions: 241 x 167 x 24 mm

You may also be interested in...

City of Light
Added to basket
Optical Document Security
Added to basket
Mixed media product
Added to basket
Engineering the Guitar
Added to basket
Remote Sensing
Added to basket


Please sign in to write a review

Your review has been submitted successfully.