Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics - 2004 - MRS Proceedings (Hardback)R. J. Carter (editor), C. S. Hau-Riege (editor), G. M. Kloster (editor), T. -M. Lu (editor), S. E. Schulz (editor)
- Not available
Publisher: Materials Research Society
Number of pages: 402
Weight: 677 g
Dimensions: 228 x 152 x 28 mm
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