The manufacturability aware routing can be performed at different routing stages including global routing, track routing, and detail routing, guided by both manufacturing process models and manufacturing-friendly rules. The manufacturability/yield optimization can be performed through both correct-by-construction (i.e., optimization during routing) as well as construct-by-correction (i.e., post-routing optimization).
This paper provides a holistic view of key design for manufacturability issues in nanometer VLSI routing.
Publisher: now publishers Inc
Number of pages: 112
Weight: 170 g
Dimensions: 234 x 156 x 6 mm
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