ISTFA 2012: Proceedings from the 38th International Symposium for Testing and Failure Analysis (Paperback)ASM International (editor)
Paperback 642 Pages / Published: 30/04/2013
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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Publisher: ASM International
Number of pages: 642
Dimensions: 229 x 152 mm
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