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ISTFA 2002: Proceedings of the 28th International Symposium for Testing and Failure Analysis, 3-7 November 2002, Phoenix, Arizona (Paperback)
  • ISTFA 2002: Proceedings of the 28th International Symposium for Testing and Failure Analysis, 3-7 November 2002, Phoenix, Arizona (Paperback)
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ISTFA 2002: Proceedings of the 28th International Symposium for Testing and Failure Analysis, 3-7 November 2002, Phoenix, Arizona (Paperback)

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£124.00
Paperback 750 Pages / Published: 01/01/2002
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Proceedings of the 28th International Symposium for Testing and Failure Analysis, 3-7 November 2002, Phoenix, Arizona. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents: Advanced Microelectronic Failure Analysis Techniques Metrology and Materials Analysis Package Level Analysis Microelectromechanical Systems Sample Preparation Failure Analysis Processes System Level Analysis Die Level Fault Isolation Discretes/Passives Scanning Probe Microscopy Techniques Test Analysis Optical Probing Yield Enhancement. (+ VAT)

Publisher: ASM International
ISBN: 9780871707710
Number of pages: 750

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