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ISTFA 2001: International Symposium for Testing and Failure Analysis
  • ISTFA 2001: International Symposium for Testing and Failure Analysis
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ISTFA 2001: International Symposium for Testing and Failure Analysis

£117.00
Mixed media product 550 Pages / Published: 01/12/2001
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Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents include: Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories.

Publisher: ASM International
ISBN: 9780871707468
Number of pages: 550
Dimensions: 230 x 156 mm

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