International Conference on Microelectronic Test Structures 2000 (Paperback)Institute of Electrical and Electronics Engineers (author)
Paperback 290 Pages / Published: 01/04/2000
- Not available
These conference proceedings cover such topics as: CD meteorology; device characterization; yield and interconnects; poster session; matching; reliability; parameter extraction; and process characterization.
Number of pages: 290
Dimensions: 279 x 216 mm
Edition: 2000 ed.
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