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International Conference on Microelectronic Test Structures 2000 (Paperback)
  • International Conference on Microelectronic Test Structures 2000 (Paperback)
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International Conference on Microelectronic Test Structures 2000 (Paperback)

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£122.50
Paperback 290 Pages / Published: 01/04/2000
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These conference proceedings cover such topics as: CD meteorology; device characterization; yield and interconnects; poster session; matching; reliability; parameter extraction; and process characterization.

Publisher: I.E.E.E.Press
ISBN: 9780780362758
Number of pages: 290
Dimensions: 279 x 216 mm
Edition: 2000 ed.

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