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International Conference on Microelectronic Test Structures 1999 (Paperback)
  • International Conference on Microelectronic Test Structures 1999 (Paperback)
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International Conference on Microelectronic Test Structures 1999 (Paperback)

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£111.95
Paperback 270 Pages / Published: 01/05/1999
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These conference papers focus on the development, measurement and analysis of test structures. Topics include: material and process characterization; device and circuit modelling; and replicated features metrology."

Publisher: I.E.E.E.Press
ISBN: 9780780352704
Number of pages: 270
Dimensions: 297 x 210 mm
Edition: 1999 ed.

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