International Conference on Microelectronic Test Structures 1998 (Paperback)
  • International Conference on Microelectronic Test Structures 1998 (Paperback)
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International Conference on Microelectronic Test Structures 1998 (Paperback)

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£109.95
Paperback 272 Pages / Published: 01/07/1998
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The papers from this international conference cover advances in developments and future directions on all microelectronic test structures and their applications for characterization of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

Publisher: I.E.E.E.Press
ISBN: 9780780343481
Number of pages: 272
Dimensions: 279 x 216 mm

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