International Conference on Microelectronic Test Structures 1996 (Paperback)
  • International Conference on Microelectronic Test Structures 1996 (Paperback)
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International Conference on Microelectronic Test Structures 1996 (Paperback)

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£95.50
Paperback 313 Pages / Published: 31/03/1996
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This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

Publisher: I.E.E.E.Press
ISBN: 9780780327832
Number of pages: 313
Weight: 953 g
Dimensions: 298 x 216 mm

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