This text brings together 77 papers from the 1998 International Conference on Applied Optical Metrology. They examine topics such as the state of the art in optical metrology, optical methods for the testing of microsystem elements, and fibre optic sensors and their applications.
Publisher: SPIE Press
Number of pages: 566
You may also be interested in...
Please sign in to write a review
Thank you for your reservation
Your order is now being processed and we have sent a confirmation email to you at
When will my order be ready to collect?
Call us on or send us an email at
Unfortunately there has been a problem with your order
Please try again or alternatively you can contact your chosen shop on or send us an email at