Image-Based Fractal Description of Microstructures (Hardback)
  • Image-Based Fractal Description of Microstructures (Hardback)

Image-Based Fractal Description of Microstructures (Hardback)

(author), (author), (author), (author)
Hardback 272 Pages / Published: 31/07/2003
  • We can order this from the publisher

Usually dispatched within 15 working days

  • This item has been added to your basket
Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes.
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.

Publisher: Springer-Verlag New York Inc.
ISBN: 9781402075070
Number of pages: 272
Weight: 1290 g
Dimensions: 235 x 155 x 17 mm
Edition: 2003 ed.

You may also be interested in...

Hydraulics and Pneumatics
Added to basket
The Simple Science of Flight
Added to basket
Electronic Properties of Materials
Added to basket
Added to basket
Mechanics of Materials For Dummies
Added to basket
The New Science of Strong Materials
Added to basket
A Dictionary of Chemical Engineering
Added to basket
The Oxford Solid State Basics
Added to basket
Engineering Materials: v. 1
Added to basket
Stuff Matters
Added to basket
Made to Measure
Added to basket

Please sign in to write a review

Your review has been submitted successfully.