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This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.
Publisher: Springer-Verlag New York Inc.
Number of pages: 272
Weight: 1290 g
Dimensions: 235 x 155 x 17 mm
Edition: 2003 ed.
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