IEEE International Test Conference (CD-ROM)IEEE (author)
CD-ROM Published: 30/11/2001
- Not available
Topics covered include: beyond DC testing at board test; BIST medley; how can we improve IDDQ testing of DSM/VDSM; practical experience with SOC testing; problems for ATE software; lecture series test and repair of large embedded DRAMs; DFT innovations; and novel techniques of fault diagnosis.
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