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IEEE International Test Conference (CD-ROM)
  • IEEE International Test Conference (CD-ROM)

IEEE International Test Conference (CD-ROM)

CD-ROM Published: 30/11/2001
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Topics covered include: beyond DC testing at board test; BIST medley; how can we improve IDDQ testing of DSM/VDSM; practical experience with SOC testing; problems for ATE software; lecture series test and repair of large embedded DRAMs; DFT innovations; and novel techniques of fault diagnosis.

Publisher: I.E.E.E.Press
ISBN: 9780780371712

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