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Flatness, Roughness, and Discrete Defects Characterization for Computer Disks Wafers, and Flat Panel Displays II (Spie Proceedings Series Volume 3275) (Paperback)
  • Flatness, Roughness, and Discrete Defects Characterization for Computer Disks Wafers, and Flat Panel Displays II (Spie Proceedings Series Volume 3275) (Paperback)
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Flatness, Roughness, and Discrete Defects Characterization for Computer Disks Wafers, and Flat Panel Displays II (Spie Proceedings Series Volume 3275) (Paperback)

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£109.00
Paperback 186 Pages / Published: 30/06/2006
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Publisher: SPIE Press
ISBN: 9780819427144
Number of pages: 186
Weight: 454 g
Dimensions: 267 x 210 x 19 mm

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