Epitaxial Growth and Real-Time Characterization of Self-Assembled Quantum Dots Using Reflection High Energy Electron Diffraction (Paperback)
  • Epitaxial Growth and Real-Time Characterization of Self-Assembled Quantum Dots Using Reflection High Energy Electron Diffraction (Paperback)
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Epitaxial Growth and Real-Time Characterization of Self-Assembled Quantum Dots Using Reflection High Energy Electron Diffraction (Paperback)

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£59.00
Paperback Published: 01/09/2011
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Publisher: Proquest, Umi Dissertation Publishing
ISBN: 9781243877468
Weight: 299 g
Dimensions: 246 x 189 x 9 mm

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