Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 37 (Hardback)
  • Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 37 (Hardback)
zoom

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 37 (Hardback)

(editor)
£179.99
Hardback 408 Pages / Published: 10/12/2007
  • We can order this

Usually despatched within 3 weeks

  • This item has been added to your basket

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Publisher: Springer-Verlag New York Inc.
ISBN: 9780387747460
Number of pages: 408
Weight: 795 g
Dimensions: 235 x 155 x 23 mm
Edition: 2008 ed.

You may also be interested in...

Physics of Nanostructured Solar Cells
Added to basket
Nanotechnology for Dummies, 2nd Edition
Added to basket
Radical Abundance
Added to basket
Nanoscience
Added to basket
£24.99
Hardback
Bionanotechnology II
Added to basket
The Gecko's Foot
Added to basket
£11.99
Paperback
Quantum Measurement and Control
Added to basket

Reviews

Please sign in to write a review

Your review has been submitted successfully.